Samsung Electronics Co., Ltd., a world leader in advanced semiconductor solutions, today announced the industry's first 45 nanometer (nm) embedded flash ("eFlash") logic process development. Samsung successfully implemented the new process into the smart card test chip, which means that this process technology fulfills the stringent quality requirements of the security solution market and can be successfully deployed on a commercial scale."Samsung's 45nm eFlash logic process has the potential to be broadly adopted into various components for security solutions and mobile devices, including smart card IC, NFC IC, eSE (embedded secure element) and TPM (Trusted platform module)," said Taehoon Kim, vice president of marketing, System LSI Business, Samsung Electronics. "The excellent performance from this smart card test chip will help solidify our leadership ...
Seoul, Korea on May. 15. 2013
Samsung Electronics Co., Ltd., the world leader in advanced memory technology, today announced the industry's first production of ul...
Seoul, Korea on Apr. 30. 2013