Microsoft and Samsung Cooperate on More Efficient Cloud ImplementationMar. 1. 2012
Munich, Germany and Seoul, Korea - March 1, 2012 : Samsung Electronics Co., Ltd., the world leader in advanced memory technology, today announced test results for servers utilizing the world´s first 20 nanometer (nm) class* Green Memory that were conducted at the Microsoft Technology Center (MTC) in Munich. A system based on Samsung´s 20nm-class DDR3 memory and solid state drives (SSDs) together with Microsoft Windows Server 2008 R2 and Hyper-V proved to be twice as fast as current memory configurations for servers setting up virtual machine instances and recovering data in private cloud environments. These advanced configurations also consumed as much as 50 percent less power per server.
Detailed findings on the testing are available in a white paper posted on Microsoft´s website : http://download.microsoft.com/download/0/5/4/05423B32-73BF-4EAA-80A8-09B5F9D9E4DE/201202_MTC_Samsung_Whitepaper_20nm_v10.pdf and on Samsung´s Green Memory website : www.samsung.com/GreenMemory.
"In an increasingly complex IT world, Microsoft Technology Centers (MTC) are set to provide complete solutions to customers, and we achieve this goal through strong collaboration with our partners. With Samsung´s Green DRAM and SSDs, we have just such a partner on board at the MTC in Munich to educate and to provide highly advanced solutions to our customers," said Chris Bayer, Director, MTC Munich.
"By utilizing the green server solution which combines the two companies´ leading-edge developments including green 20nm-class DRAM and SSD, our customers can enjoy achieving high level of performance and efficiency in their server systems and also highly effective IT investment without having to increase the total cost of ownership," said Wanhoon Hong, executive vice president of memory sales & marketing, Device Solutions, Samsung Electronics.
"Samsung will step up the collaboration with MTC in both technological advancements and marketing promotions in a diversity of area including solutions for data centers, and keep on developing green computing solutions for more effective state-level of IT investment," Hong added.
Bayer commented, "Energy savings and a green strategy are on the agenda of every enterprise. Test results show that the joint solution not only offers energy savings, but also improves system performance dramatically. I am confident that we will get the attention of CIOs and end users alike."
Samsung´s 20nm-class Green was tested in 8GB DDR3 registered dual inline memory modules and in the SATA 6Gb/s 256GB SSD PM830 series, installed on server systems running virtualized environments with the Windows Server 2008 R2 Enterprise operating system and Hyper-V. They delivered power conservation and time savings of 50 percent compared to systems using 40nm-class* DDR3 and enterprise grade HDD.
Samsung enabled the Green Memory solution that combines 20nm-class DDR3 modules and SATA 6Gbps SSDs for advanced server systems only 5 months after collaborating with MTC Munich for development of an optimized server solution that utilizes 30nm-class green DDR3 memory modules.
Samsung and Microsoft are planning to extend their collaboration to the other 27 MTCs worldwide in 2012. Test platforms equipped with Samsung Green SSDs are now available at MTC Munich and 20nm-class DDR3 server modules will be available at MTC Munich in the second quarter of this year.
About Microsoft Technology Center
Microsoft Technology Centers are collaborative environments that provide access to innovative technologies and world-class expertise, enabling you to envision, design, and deploy solutions to meet your exact needs. http://www.microsoft.com/mtc/
Samsung and the stylized Samsung design are trademarks and service marks of Samsung Electronics Co., Ltd. Other trademarks are the property of their respective owners.
Editors´ Note : 20nm-class means a process technology node somewhere between 20 and 29 nanometers, and 40nm-class means a process technology node somewhere between 40 and 49 nanometers.