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Maximizing MLC NAND Flash Reliability
Designers need to bolster NAND flash reliability as the industry shrinks process geometries down to the 40 and 30 nanometer nodes. Reliability degradation is an unavoidable by-product of process shrink.  It is important to wisely manage reliability based on the application usage model as it clearly delineated in this technical feature.  MLC NAND flash devices today can exceed the lifetime and reliability requirements of typical consumer devices on the market with the right hardware / software solutions.
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